From Modeling to Test Case Generation in the Industrial Embedded System Domain

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Authors: Aliya Hussain, Saurabh Tiwari, Jagadish Suryadevara, Eduard Enoiu

Journal title: Software Technologies: Applications and Foundations - STAF 2018 Collocated Workshops, Toulouse, France, June 25-29, 2018, Revised Selected Papers

Journal number: 11176

Journal publisher: Springer International Publishing

Published year: 2018

Published pages: 499-505

DOI identifier: 10.1007/978-3-030-04771-9_35

ISBN: 978-3-030-04770-2