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Authors: Sahar Tahvili, Leo Hatvani, Michael Felderer, Wasif Afzal, Markus Bohlin
Journal title: 2019 IEEE International Conference On Artificial Intelligence Testing (AITest)
Journal publisher: IEEE
Published year: 2019
Published pages: 19-26
DOI identifier: 10.1109/aitest.2019.00-13
ISBN: 978-1-7281-0492-8