SaSeVAL: A Safety/Security-Aware Approach for Validation of Safety-Critical Systems

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Authors: Wolschke, Christian; Sangchoolie, Behrooz; Simon, Jacob; Marksteiner, Stefan; Braun, Tobias; Hamazaryan, Hayk

Journal title: 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)

Journal number: 2

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/dsn-w52860.2021.00016

ISBN: 978-1-6654-3950-3