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Authors: Simone Vuotto, Massimo Narizzano, Luca Pulina, Armando Tacchella
Journal title: 2019 IEEE/ACM 6th International Workshop on Requirements Engineering and Testing (RET)
Journal publisher: IEEE
Published year: 2019
Published pages: 13-16
DOI identifier: 10.1109/ret.2019.00010
ISBN: 978-1-7281-2274-8
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