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Authors: Simone Vuotto, Massimo Narizzano, Luca Pulina, Armando Tacchella
Journal title: 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST)
Journal publisher: IEEE
Published year: 2019
Published pages: 363-366
DOI identifier: 10.1109/icst.2019.00043
ISBN: 978-1-7281-1736-2