Resources
Multi-Subband Ensemble Monte Carlo simulation of Si nanowire MOSFETs
Project: WAYTOGO FAST
Updated at: 29-04-2024
Threshold voltage and on-current Variability related to interface traps spatial distribution
Project: WAYTOGO FAST
Updated at: 29-04-2024
Impact of non uniform strain configuration on transport properties for FD14+ devices
Project: WAYTOGO FAST
Updated at: 29-04-2024
Systematic evaluation of SOI Buried Oxide reliability for partially depleted and fully depleted applications
Project: WAYTOGO FAST
Updated at: 29-04-2024
Impact of S/D tunneling in ultrascaled devices, a Multi-Subband Ensemble Monte Carlo study
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Novel chip embedding and interconnection technology for mm-wave System-in-Package (SiP) applications,”
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Slow-wave coplanar strip line based Low-power 80-GHz Voltage Control Oscillator on 22-nm FDSOI technology,”
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Engineered substrates for low-power devices”
Project: WAYTOGO FAST
Updated at: 29-04-2024
Interest of SiCO low k=4.5 spacer deposited at low temperature (400°C) in the perspective of 3D VLSI integration
Project: WAYTOGO FAST
Updated at: 29-04-2024
Physical modeling - A new paradigm in device simulation
Project: WAYTOGO FAST
Updated at: 29-04-2024
Confinement orientation effects in S/D tunneling
Project: WAYTOGO FAST
Updated at: 29-04-2024
Localized STRASS Technique on Advanced FDSOI Platform: Highly Tensile Si Demonstration for Dual Strain CMOS Integration
Project: WAYTOGO FAST
Updated at: 29-04-2024
A New Method to Induce Local Tensile Strain in SOI Wafers: First Strain Results of the “BOX Creep” Technique”
Project: WAYTOGO FAST
Updated at: 29-04-2024
(Invited) Epitaxial Growth of Low Defect SiGe Buffer Layers for Integration of New Materials on 300 mm Silicon Wafers
Project: WAYTOGO FAST
Updated at: 29-04-2024
BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Investigation of Hot Carrier reliability of SOI and sSOI transistors using Back Bias”
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Material and Device Innovation for Cost Effective CMOS Scaling Beyond 28nm”
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Beyond Silicon CMOS: Progress and challenges”
Project: WAYTOGO FAST
Updated at: 29-04-2024
22nm FDSOI technology for emerging mobile, Internet-of-Things, and RF applications
Project: WAYTOGO FAST
Updated at: 29-04-2024
The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques
Project: WAYTOGO FAST
Updated at: 29-04-2024
300 mm SiGe-On-Insulator Substrates with High Ge Content (70%) Fabricated Using the Smart Cut Technology
Project: WAYTOGO FAST
Updated at: 29-04-2024
Out-of-equilibrium body potential measurements in pseudo-MOSFET for biosensing
Project: WAYTOGO FAST
Updated at: 29-04-2024
Systematic method for electrical characterization of random telegraph noise in MOSFETs
Project: WAYTOGO FAST
Updated at: 29-04-2024
Out-of-equilibrium body potential measurements in pseudo-MOSFET for sensing applications
Project: WAYTOGO FAST
Updated at: 29-04-2024