The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques
Project: WAYTOGO FAST
Updated at: 29-04-2024
Resources
5625 items found
300 mm SiGe-On-Insulator Substrates with High Ge Content (70%) Fabricated Using the Smart Cut Technology
Project: WAYTOGO FAST
Updated at: 29-04-2024
Systematic method for electrical characterization of random telegraph noise in MOSFETs
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Substrate maturity+D61:M61+D61:M61 and readiness in large volume to support mass adoption of ULP FDSOI platforms”
Project: WAYTOGO FAST
Updated at: 29-04-2024
“How innovation and eco-system in Europe can enable future requirements in automotive electronics”
Project: WAYTOGO FAST
Updated at: 29-04-2024
“Designing with FD-SOI Technologies”
Project: WAYTOGO FAST
Updated at: 29-04-2024
Performance and layout effects of SiGe channel in 14nm UTBB FDSOI: SiGe-first vs. SiGe-last integration
Project: WAYTOGO FAST
Updated at: 29-04-2024
A novel dual isolation scheme for stress and back-bias maximum efficiency in FDSOI Technology
Project: WAYTOGO FAST
Updated at: 29-04-2024
Characterization and modelling of layout effects in SiGe channel pMOSFETs from 14nm UTBB FDSOI technology
Project: WAYTOGO FAST
Updated at: 29-04-2024
Vertically stacked-NanoWires MOSFETs in a replacement metal gate process with inner spacer and SiGe source/drain
Project: WAYTOGO FAST
Updated at: 29-04-2024
Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution
Project: WAYTOGO FAST
Updated at: 29-04-2024
Smart solutions for efficient dual strain integration for future FDSOI generations
Project: WAYTOGO FAST
Updated at: 29-04-2024
In-line monitoring of strain distribution using high resolution X-ray Reciprocal space mapping into 20 nm SiGe pMOS
Project: WAYTOGO FAST
Updated at: 29-04-2024
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
Project: WAYTOGO FAST
Updated at: 29-04-2024
Insights on the Body Charging and Noise Generation by Impact Ionization in Fully Depleted SOI MOSFETs
Project: WAYTOGO FAST
Updated at: 29-04-2024
TCAD-based characterization of logic cells: Power, performance, area, and variability
Project: WAYTOGO FAST
Updated at: 29-04-2024
Impact of strain on access resistance in planar and nanowire CMOS devices
Project: WAYTOGO FAST
Updated at: 29-04-2024
Physical transport simulation for path-finding and device optimization
Project: WAYTOGO FAST
Updated at: 29-04-2024
Towards physics-based DTCO for performance of advanced technology nodes
Project: WAYTOGO FAST
Updated at: 29-04-2024
Impact of the design layout on threshold voltage in SiGe channel UTBB-FDSOI pMOSFET
Project: WAYTOGO FAST
Updated at: 29-04-2024
Phase-space solution of the subband Boltzmann transport equation for nano-scale TCAD
Project: WAYTOGO FAST
Updated at: 29-04-2024
Mechanical simulations of BOX creep for strained FDSOI
Project: WAYTOGO FAST
Updated at: 29-04-2024